Characterization of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process
2024-01-01 Aglieri Rinella, Gianluca; Alocco, Giacomo; Antonelli, Matias; Baccomi, Roberto; Beole, Stefania Maria; Blidaru, Mihail Bogdan; Buttwill, Bent Benedikt; Buschmann, Eric; Camerini, Paolo; Carnesecchi, Francesca; Chartier, Marielle; Choi, Yongjun; Colocci, Manuel; Contin, Giacomo; Dannheim, Dominik; De Gruttola, Daniele; Del Rio Viera, Manuel; Dubla, Andrea; di Mauro, Antonello; Donner, Maurice Calvin; Eberwein, Gregor Hieronymus; Egger, Jan; Fabbietti, Laura; Feindt, Finn; Gautam, Kunal; Gernhaeuser, Roman; Glover, James Julian; Gonella, Laura; Gran Grodaas, Karl; Gregor, Ingrid-Maria; Hillemanns, Hartmut; Huth, Lennart; Ilg, Armin; Isakov, Artem; Jones, Daniel Matthew; Junique, Antoine; Kaewjai, Jetnipit; Keil, Markus; Kim, Jiyoung; Kluge, Alex; Kobdaj, Chinorat; Kotliarov, Artem; Kittimanapun, Kritsada; Křížek, Filip; Kucharska, Gabriela; Kushpil, Svetlana; La Rocca, Paola; Laojamnongwong, Natthawut; Lautner, Lukas; Lemmon, Roy Crawford; Lemoine, Corentin; Li, Long; Librizzi, Francesco; Liu, Jian; Macchiolo, Anna; Mager, Magnus; Marras, Davide; Martinengo, Paolo; Masciocchi, Silvia; Mattiazzo, Serena; Menzel, Marius Wilm; Mulliri, Alice; Musta, Alexander; Mylne, Mia Rose; Piro, Francesco; Rachevski, Alexandre; Rasà, Marika; Rebane, Karoliina; Reidt, Felix; Ricci, Riccardo; Ruiz Daza, Sara; Saccà, Gaspare; Sanna, Isabella; Sarritzu, Valerio; Schlaadt, Judith; Schledewitz, David; Scioli, Gilda; Senyukov, Serhiy; Simancas, Adriana; Snoeys, Walter; Spannagel, Simon; Šuljić, Miljenko; Sturniolo, Alessandro; Tiltmann, Nicolas; Trifirò, Antonio; Usai, Gianluca; Vanat, Tomas; Van Beelen, Jacob Bastiaan; Varga, Laszlo; Verdoglia, Michele; Vignola, Gianpiero; Villani, Anna; Wennloef, Haakan; Witte, Jonathan; Wittwer, Rebekka Bettina