The extensive upgrade of the experimental end-station of the SPECTROMICROSCOPY-3.2L beamline at Elettra synchrotron light source is reported. After the upgrade, angle-resolved photoemission spectroscopy from a submicrometre spot and scanning microscopy images monitoring the photoelectron signal inside selected acquisition angle and energy windows can be performed. As a test case, angle-resolved photoemission spectroscopy from single flakes of highly oriented pyrolitic graphite and imaging of the flakes with image contrast owing to rotation of the band dispersion of different flakes are presented
Angle-resolved photoemission spectroscopy and imaging with a submicrometre probe at the SPECTROMICROSCOPY-3.2L beamline of Elettra
CAUTERO, GIUSEPPE;
2010-01-01
Abstract
The extensive upgrade of the experimental end-station of the SPECTROMICROSCOPY-3.2L beamline at Elettra synchrotron light source is reported. After the upgrade, angle-resolved photoemission spectroscopy from a submicrometre spot and scanning microscopy images monitoring the photoelectron signal inside selected acquisition angle and energy windows can be performed. As a test case, angle-resolved photoemission spectroscopy from single flakes of highly oriented pyrolitic graphite and imaging of the flakes with image contrast owing to rotation of the band dispersion of different flakes are presentedFile in questo prodotto:
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