The problem of an objective identification of defects supporting Partial Discharges (PD) in different types of insulation systems adopted in ac rotating machines, is approached. The solution proposed here relies on a set of robust identification markers capable of describing the shape of the PD patterns resorting to a tree structure according to the symmetry/asymmetry of PD in voltage phase and polarity. A fuzzy tree structure is used to reflect the inherent uncertainty of source identification based on the shape analysis in the identification results. PD occurring in the same defective component used in different insulation technologies (e.g., Resin-Rich or VPI technology, taped or varnished stress-grading system), can generate different PD patterns. Thus, different tree-structures, each one pertinent to an insulation technology, have been developed to achieve a more accurate defect identification even if the problem of ambiguous PD patterns requires additional investigations.

Identification of Defects Supporting PD in Rotating Machines with Different Insulation Technologies

Alfredo Contin
Writing – Review & Editing
;
2018-01-01

Abstract

The problem of an objective identification of defects supporting Partial Discharges (PD) in different types of insulation systems adopted in ac rotating machines, is approached. The solution proposed here relies on a set of robust identification markers capable of describing the shape of the PD patterns resorting to a tree structure according to the symmetry/asymmetry of PD in voltage phase and polarity. A fuzzy tree structure is used to reflect the inherent uncertainty of source identification based on the shape analysis in the identification results. PD occurring in the same defective component used in different insulation technologies (e.g., Resin-Rich or VPI technology, taped or varnished stress-grading system), can generate different PD patterns. Thus, different tree-structures, each one pertinent to an insulation technology, have been developed to achieve a more accurate defect identification even if the problem of ambiguous PD patterns requires additional investigations.
2018
978-1-5386-6389-9
ieeexplore.ieee.org
File in questo prodotto:
File Dimensione Formato  
toc conference+Contin.pdf

Accesso chiuso

Tipologia: Documento in Versione Editoriale
Licenza: Copyright Editore
Dimensione 1.06 MB
Formato Adobe PDF
1.06 MB Adobe PDF   Visualizza/Apri   Richiedi una copia
Pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11368/2939006
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 3
  • ???jsp.display-item.citation.isi??? 0
social impact