The Silicon Vertex Detector of the Belle II Experiment

Kaliyar, A. B.; Adamczyk, K.; Aggarwal, L.; Aihara, H.; Aziz, T.; Bacher, S.; Bahinipati, S.; Batignani, G.; Baudot, J.; Behera, P. K.; Bettarini, S.; Bilka, T.; Bozek, A.; Buchsteiner, F.; Casarosa, G.; Corona, L.; Das, S.; Dujany, G.; Finck, C.; Forti, F.; Friedl, M.; Gabrielli, A.; Gobbo, B.; Halder, S.; Hara, K.; Hazra, S.; Higuchi, T.; Irmler, C.; Ishikawa, A.; Jin, Y.; Kaleta, M.; Kandra, J.; Kang, K. H.; Kodyš, P.; Kohriki, T.; Kumar, R.; Lalwani, K.; Lautenbach, K.; Leboucher, R.; Lee, S. C.; Libby, J.; Martel, L.; Massaccesi, L.; Mohanty, G. B.; Mondal, S.; Nakamura, K. R.; Natkaniec, Z.; Onuki, Y.; Otani, F.; Paladino, A.; Paoloni, E.; Park, H.; Polat, L.; Rao, K. K.; Ripp-Baudot, I.; Rizzo, G.; Sato, Y.; Schwanda, C.; Serrano, J.; Shimasaki, T.; Suzuki, J.; Tanaka, S.; Tanigawa, H.; Tenchini, F.; Thalmeier, R.; Tiwary, R.; Tsuboyama, T.; Uematsu, Y.; Vitale, L.; Wang, Z. M.; Webb, J.; Werbycka, O.; Wiechczynski, J.; Yin, H.; Zani, L.

doi:10.22323/1.468.0114

The Belle II silicon vertex detector (SVD) is a four-layer double-sided silicon strip detector installed within the Belle II detector located at KEK, Japan. The SVD has been operating smoothly and reliably since the start of data taking in March 2019. The data quality and radiation damage effects have been continuously monitored. In this article, we report the operational experience of SVD, reconstruction performance, and effects of beam background and radiation damage. We also discuss some of the recent efforts to improve the software robustness targeting the high luminosity scenario and hardware activities performed during the first long shutdown of the Belle II experiment.

The Silicon Vertex Detector of the Belle II Experiment / Kaliyar, A. B.; Adamczyk, K.; Aggarwal, L.; Aihara, H.; Aziz, T.; Bacher, S.; Bahinipati, S.; Batignani, G.; Baudot, J.; Behera, P. K.; Bettarini, S.; Bilka, T.; Bozek, A.; Buchsteiner, F.; Casarosa, G.; Corona, L.; Das, S.; Dujany, G.; Finck, C.; Forti, F.; Friedl, M.; Gabrielli, A.; Gobbo, B.; Halder, S.; Hara, K.; Hazra, S.; Higuchi, T.; Irmler, C.; Ishikawa, A.; Jin, Y.; Kaleta, M.; Kandra, J.; Kang, K. H.; Kodyš, P.; Kohriki, T.; Kumar, R.; Lalwani, K.; Lautenbach, K.; Leboucher, R.; Lee, S. C.; Libby, J.; Martel, L.; Massaccesi, L.; Mohanty, G. B.; Mondal, S.; Nakamura, K. R.; Natkaniec, Z.; Onuki, Y.; Otani, F.; Paladino, A.; Paoloni, E.; Park, H.; Polat, L.; Rao, K. K.; Ripp-Baudot, I.; Rizzo, G.; Sato, Y.; Schwanda, C.; Serrano, J.; Shimasaki, T.; Suzuki, J.; Tanaka, S.; Tanigawa, H.; Tenchini, F.; Thalmeier, R.; Tiwary, R.; Tsuboyama, T.; Uematsu, Y.; Vitale, L.; Wang, Z. M.; Webb, J.; Werbycka, O.; Wiechczynski, J.; Yin, H.; Zani, L.. - In: POS PROCEEDINGS OF SCIENCE. - ISSN 1824-8039. - 468:(2025), pp. 1-6. ( 6th International Conference on Technology and Instrumentation in Particle Physics, TIPP 2023 Cape Town, Western Cape, South Africa 4 - 8 Sep 2023) [10.22323/1.468.0114].