The baseline detector option for the first layer of the SuperB Silicon Vertex Tracker (SVT) is a high resistivity double-sided silicon device with short strips (striplets) at 451 angle to the detector’s edge. A prototype was tested with a 120 GeV/c pion beam in September 2011 at the SPS-H6 test-beam line at CERN. In this paper studies on efficiency, resolution and cluster size are reported.

Beam test results for the SuperB-SVT thin striplet detector

BOMBEN, MARCO;BOSISIO, LUCIANO;LANCERI, LIVIO;RASHEVSKAYA, IRINA;STELLA, CARLO;VITALE, LORENZO
2013

Abstract

The baseline detector option for the first layer of the SuperB Silicon Vertex Tracker (SVT) is a high resistivity double-sided silicon device with short strips (striplets) at 451 angle to the detector’s edge. A prototype was tested with a 120 GeV/c pion beam in September 2011 at the SPS-H6 test-beam line at CERN. In this paper studies on efficiency, resolution and cluster size are reported.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11368/2768120
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