The baseline detector option for the first layer of the SuperB Silicon Vertex Tracker (SVT) is a high resistivity double-sided silicon device with short strips (striplets) at 451 angle to the detector’s edge. A prototype was tested with a 120 GeV/c pion beam in September 2011 at the SPS-H6 test-beam line at CERN. In this paper studies on efficiency, resolution and cluster size are reported.
Titolo: | Beam test results for the SuperB-SVT thin striplet detector |
Autori: | |
Data di pubblicazione: | 2013 |
Rivista: | |
Abstract: | The baseline detector option for the first layer of the SuperB Silicon Vertex Tracker (SVT) is a high resistivity double-sided silicon device with short strips (striplets) at 451 angle to the detector’s edge. A prototype was tested with a 120 GeV/c pion beam in September 2011 at the SPS-H6 test-beam line at CERN. In this paper studies on efficiency, resolution and cluster size are reported. |
Handle: | http://hdl.handle.net/11368/2768120 |
Digital Object Identifier (DOI): | http://dx.doi.org/10.1016/j.nima.2012.10.086 |
Appare nelle tipologie: | 1.1 Articolo in Rivista |
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