Self-assembled metal phthalocyanine thin films are receiving considerable interest due to their potential technological applications. In this study, we present a comprehensive study of CoPc and FePc thin films of about 50 nm thickness on technologically relevant substrates such as SiOx/Si, indium tin oxide (ITO) and polycrystalline gold in order to investigate the substrate induced effects on molecular stacking and crystal structure. Raman spectroscopic analysis reveals lower intensity for the vibrational bands corresponding to phthalocyanine macrocycle for the CoPc and FePc thin films grown on ITO as compared to SiOx/Si due to the higher order of phthalocyanine molecules on SiOx/Si. Atomic force microscopy analysis displays higher grain size for FePc and CoPc thin films on ITO as compared to SiOx/Si and polycrystalline gold indicating towards the influence of molecule–substrate interactions on the molecular stacking. Grazing incidence X-ray diffraction reciprocal space maps reveal that FePc and CoPc molecules adopt a combination of herringbone and brickstone arrangement on SiOx/Si and polycrystalline gold substrate, which can have significant implications on the optoelectronic properties of the films due to unique molecular stacking.
Titolo: | Influence of substrate on molecular order for self-assembled adlayers of CoPc and FePc |
Autori: | |
Data di pubblicazione: | 2018 |
Data ahead of print: | 12-feb-2018 |
Stato di pubblicazione: | Pubblicato |
Rivista: | |
Abstract: | Self-assembled metal phthalocyanine thin films are receiving considerable interest due to their potential technological applications. In this study, we present a comprehensive study of CoPc and FePc thin films of about 50 nm thickness on technologically relevant substrates such as SiOx/Si, indium tin oxide (ITO) and polycrystalline gold in order to investigate the substrate induced effects on molecular stacking and crystal structure. Raman spectroscopic analysis reveals lower intensity for the vibrational bands corresponding to phthalocyanine macrocycle for the CoPc and FePc thin films grown on ITO as compared to SiOx/Si due to the higher order of phthalocyanine molecules on SiOx/Si. Atomic force microscopy analysis displays higher grain size for FePc and CoPc thin films on ITO as compared to SiOx/Si and polycrystalline gold indicating towards the influence of molecule–substrate interactions on the molecular stacking. Grazing incidence X-ray diffraction reciprocal space maps reveal that FePc and CoPc molecules adopt a combination of herringbone and brickstone arrangement on SiOx/Si and polycrystalline gold substrate, which can have significant implications on the optoelectronic properties of the films due to unique molecular stacking. |
Handle: | http://hdl.handle.net/11368/2916968 |
Digital Object Identifier (DOI): | http://dx.doi.org/10.1002/jrs.5344 |
URL: | http://onlinelibrary.wiley.com/doi/10.1002/jrs.5344 |
Appare nelle tipologie: | 1.1 Articolo in Rivista |
File in questo prodotto:
File | Descrizione | Tipologia | Licenza | |
---|---|---|---|---|
Kumar_et_al-2018-Journal_of_Raman_Spectroscopy.pdf | Documento in Versione Editoriale | Copyright Editore | Administrator Richiedi una copia | |
jrs5344-sup-001-Table_S1.pdf | supporting information | Altro materiale allegato | Copyright Editore | Administrator Richiedi una copia |
3904_11368_2916968_EUT.pdf | This is the peer reviewed version of the article, which has been published in final form at https://doi.org/10.1002/jrs.5344. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions. | Bozza finale post-referaggio (post-print) | Copyright Editore | Open Access Visualizza/Apri |