This work presents the latest findings of an ongoing research project Billé et al. [1] where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system [2] deployed on the TwinMic beamline [3]
XRF topography information: Simulations and data from a novel silicon drift detector system
Cautero G.;Bufon J.;Rashevskaya I.;Picciotto A.;Vacchi A.;
2019-01-01
Abstract
This work presents the latest findings of an ongoing research project Billé et al. [1] where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system [2] deployed on the TwinMic beamline [3]File in questo prodotto:
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