This work presents the latest findings of an ongoing research project Billé et al. [1] where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system [2] deployed on the TwinMic beamline [3]

XRF topography information: Simulations and data from a novel silicon drift detector system

Cautero G.;Bufon J.;Rashevskaya I.;Picciotto A.;Vacchi A.;
2019-01-01

Abstract

This work presents the latest findings of an ongoing research project Billé et al. [1] where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system [2] deployed on the TwinMic beamline [3]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11368/2954991
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