This work presents the latest findings of an ongoing research project Billé et al. [1] where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system [2] deployed on the TwinMic beamline [3]
XRF topography information: Simulations and data from a novel silicon drift detector system / Kourousias, G.; Bille, F.; Cautero, G.; Bufon, J.; Rachevski, A.; Schillani, S.; Cirrincione, D.; Altissimo, M.; Menk, R. H.; Zampa, G.; Zampa, N.; Rashevskaya, I.; Borghes, R.; Gandola, M.; Picciotto, A.; Borghi, G.; Ficorella, F.; Zorzi, N.; Bellutti, P.; Bertuccio, G.; Vacchi, A.; Gianoncelli, A.. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - 936:(2019), pp. 80-81. [10.1016/j.nima.2018.10.142]
XRF topography information: Simulations and data from a novel silicon drift detector system
Cautero G.;Bufon J.;Rashevskaya I.;Picciotto A.;Vacchi A.;
2019-01-01
Abstract
This work presents the latest findings of an ongoing research project Billé et al. [1] where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system [2] deployed on the TwinMic beamline [3]| File | Dimensione | Formato | |
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