A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolution far exceeds that accessible to methods of directly probing the focus. Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics. © 2010 Elsevier B.V. All rights reserved.
Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics / Kewish, Cameron M.; Thibault, Pierre; Dierolf, Martin; Bunk, Oliver; Menzel, Andreas; Vila-Comamala, Joan; Jefimovs, Konstantins; Pfeiffer, Franz. - In: ULTRAMICROSCOPY. - ISSN 0304-3991. - 110:4(2010), pp. 325-329. [10.1016/j.ultramic.2010.01.004]
Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics
Pierre Thibault;
2010-01-01
Abstract
A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolution far exceeds that accessible to methods of directly probing the focus. Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics. © 2010 Elsevier B.V. All rights reserved.Pubblicazioni consigliate
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