We investigate the early stages of the growth of zinc-phthalocyanine on Al(100) using X-ray photoemission spectroscopy (XPS) and low-energy electron diffraction (LEED). Diffraction patterns show a (5 × 5) reconstruction, characteristic of flat-lying molecules forming a long-range-ordered structure with a square unit cell. The degree of ordering (i.e., the average domain size) is increased when the substrate is kept above 100 °C during the deposition. At low coverage (≤1 ML), a sizeable charge transfer from the substrate to the molecules is observed, indicating a strong interaction at the organic–inorganic interface. As a consequence of charge filling of ZnPc LUMO, a self-demetalation of the molecule occurs while the structure of the ligand remains mostly unaffected.
Strong Chemical Interaction and Self-Demetalation of Zinc-Phthalocyanine on Al(100)
Cvetko, Dean;Kladnik, Gregor;Morgante, Alberto;
2020-01-01
Abstract
We investigate the early stages of the growth of zinc-phthalocyanine on Al(100) using X-ray photoemission spectroscopy (XPS) and low-energy electron diffraction (LEED). Diffraction patterns show a (5 × 5) reconstruction, characteristic of flat-lying molecules forming a long-range-ordered structure with a square unit cell. The degree of ordering (i.e., the average domain size) is increased when the substrate is kept above 100 °C during the deposition. At low coverage (≤1 ML), a sizeable charge transfer from the substrate to the molecules is observed, indicating a strong interaction at the organic–inorganic interface. As a consequence of charge filling of ZnPc LUMO, a self-demetalation of the molecule occurs while the structure of the ligand remains mostly unaffected.File | Dimensione | Formato | |
---|---|---|---|
acs.jpcc.0c06980SelfDemetalZnPc_2020.pdf
Accesso chiuso
Descrizione: Articolo principale
Tipologia:
Documento in Versione Editoriale
Licenza:
Copyright Editore
Dimensione
1.78 MB
Formato
Adobe PDF
|
1.78 MB | Adobe PDF | Visualizza/Apri Richiedi una copia |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.