The FE-I4 is a new pixel readout integrated circuit designed to meet the requirements of ATLAS experiment upgrades. The first samples of the FE-I4 engineering run (called FE-I4A) delivered promising results in terms of the requested performances. The FE-I4 team envisaged a number of modifications and fine-tuning before the actual exploitation, planned within the Insertable B-Layer (IBL) of ATLAS. As the IBL schedule was pushed significantly forward, a quick and efficient plan had to be devised for the FE-I4 redesign. This article will present the main objectives of the resubmission, together with the major changes that were a driving factor for this redesign. In addition, the top-level verification and test efforts of the FE-I4 will also be addressed.
The FE-I4 pixel readout system-on-chip resubmission for the insertable B-Layer project / Zivkovic, V., Schipper, J.d., Garcia-Sciveres, M., Mekkaoui, A., Barbero, M., Darbo, G., Gnani, D., Hemperek, T., Menouni, M., Fougeron, D., Gensolen, F., Jensen, F., Caminada, L., Gromov, V., Kluit, R., Fleury, J., Kruger, H., Backhaus, M., Fang, X., Gonella, L., et al.. - In: JOURNAL OF INSTRUMENTATION. - ISSN 1748-0221. - 7:(2012). [10.1088/1748-0221/7/02/C02050]
The FE-I4 pixel readout system-on-chip resubmission for the insertable B-Layer project
Gonella L;
2012-01-01
Abstract
The FE-I4 is a new pixel readout integrated circuit designed to meet the requirements of ATLAS experiment upgrades. The first samples of the FE-I4 engineering run (called FE-I4A) delivered promising results in terms of the requested performances. The FE-I4 team envisaged a number of modifications and fine-tuning before the actual exploitation, planned within the Insertable B-Layer (IBL) of ATLAS. As the IBL schedule was pushed significantly forward, a quick and efficient plan had to be devised for the FE-I4 redesign. This article will present the main objectives of the resubmission, together with the major changes that were a driving factor for this redesign. In addition, the top-level verification and test efforts of the FE-I4 will also be addressed.Pubblicazioni consigliate
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