The complex electronic properties of ZrTe5 have recently stimulated in-depth investigations that assigned this material to either a topological insulator or a 3D Dirac semimetal phase. Here we report a comprehensive experimental and theoretical study of both electronic and structural properties of ZrTe5, revealing that the bulk material is a strong topological insulator (STI). By means of angle-resolved photoelectron spectroscopy, we identify at the top of the valence band both a surface and a bulk state. The dispersion of these bands is well captured by ab initio calculations for the STI case, for the specific interlayer distance measured in our x-ray diffraction study. Furthermore, these findings are supported by scanning tunneling spectroscopy revealing the metallic character of the sample surface, thus confirming the strong topological nature of ZrTe5.
Evidence for a Strong Topological Insulator Phase in ZrTe5 / Manzoni, Giulia; Gragnaniello, L.; Autès, G.; Kuhn, T.; Sterzi, Andrea; Cilento, Federico; Zacchigna, Michele; Enenkel, V.; Vobornik, I.; Barba, L.; Bisti, F.; Bugnon, P. h.; Magrez, A.; Strocov, V. . N.; Berger, H.; Yazyev, O. . v.; Fonin, M.; Parmigiani, Fulvio; Crepaldi, Alberto. - In: PHYSICAL REVIEW LETTERS. - ISSN 0031-9007. - 117:23(2016), pp. 237601.1-237601.5. [10.1103/PhysRevLett.117.237601]
Evidence for a Strong Topological Insulator Phase in ZrTe5
MANZONI, GIULIA;STERZI, ANDREA;CILENTO, FEDERICO;ZACCHIGNA, MICHELE;PARMIGIANI, FULVIO;CREPALDI, ALBERTO
2016-01-01
Abstract
The complex electronic properties of ZrTe5 have recently stimulated in-depth investigations that assigned this material to either a topological insulator or a 3D Dirac semimetal phase. Here we report a comprehensive experimental and theoretical study of both electronic and structural properties of ZrTe5, revealing that the bulk material is a strong topological insulator (STI). By means of angle-resolved photoelectron spectroscopy, we identify at the top of the valence band both a surface and a bulk state. The dispersion of these bands is well captured by ab initio calculations for the STI case, for the specific interlayer distance measured in our x-ray diffraction study. Furthermore, these findings are supported by scanning tunneling spectroscopy revealing the metallic character of the sample surface, thus confirming the strong topological nature of ZrTe5.| File | Dimensione | Formato | |
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