The complex electronic properties of ZrTe5 have recently stimulated in-depth investigations that assigned this material to either a topological insulator or a 3D Dirac semimetal phase. Here we report a comprehensive experimental and theoretical study of both electronic and structural properties of ZrTe5, revealing that the bulk material is a strong topological insulator (STI). By means of angle-resolved photoelectron spectroscopy, we identify at the top of the valence band both a surface and a bulk state. The dispersion of these bands is well captured by ab initio calculations for the STI case, for the specific interlayer distance measured in our x-ray diffraction study. Furthermore, these findings are supported by scanning tunneling spectroscopy revealing the metallic character of the sample surface, thus confirming the strong topological nature of ZrTe5.
Evidence for a Strong Topological Insulator Phase in ZrTe5 / Manzoni, G., Gragnaniello, L., Autès, G., Kuhn, T., Sterzi, A., Cilento, F., Zacchigna, M., Enenkel, V., Vobornik, I., Barba, L., Bisti, F., Bugnon, P.h., Magrez, A., Strocov, V. .N., Berger, H., Yazyev, O. .v., Fonin, M., Parmigiani, F., Crepaldi, A.. - In: PHYSICAL REVIEW LETTERS. - ISSN 0031-9007. - 117:23(2016), pp. 237601.1-237601.5. [10.1103/PhysRevLett.117.237601]
Evidence for a Strong Topological Insulator Phase in ZrTe5
MANZONI, GIULIA;STERZI, ANDREA;CILENTO, FEDERICO;ZACCHIGNA, MICHELE;PARMIGIANI, FULVIO;CREPALDI, ALBERTO
2016-01-01
Abstract
The complex electronic properties of ZrTe5 have recently stimulated in-depth investigations that assigned this material to either a topological insulator or a 3D Dirac semimetal phase. Here we report a comprehensive experimental and theoretical study of both electronic and structural properties of ZrTe5, revealing that the bulk material is a strong topological insulator (STI). By means of angle-resolved photoelectron spectroscopy, we identify at the top of the valence band both a surface and a bulk state. The dispersion of these bands is well captured by ab initio calculations for the STI case, for the specific interlayer distance measured in our x-ray diffraction study. Furthermore, these findings are supported by scanning tunneling spectroscopy revealing the metallic character of the sample surface, thus confirming the strong topological nature of ZrTe5.| File | Dimensione | Formato | |
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Manzoni_PhysRevLett.117.237601.pdf
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Manzoni_PRL2_SuppMat_ZrTe5_STI_v4.pdf
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