Wavefront-marking X-ray imaging techniques use e.g., sandpaper or a grating to generate intensity fluctuations, and analyze their distortion by the sample in order to retrieve attenuation, phase-contrast, and dark-field information. Phase contrast yields an improved visibility of soft-tissue specimens, while dark-field reveals small-angle scatter from sub-resolution structures. Both have found many biomedical and engineering applications. The previously developed Unified Modulated Pattern Analysis (UMPA) model extracts these modalities from wavefront-marking data. We here present a new UMPA implementation, capable of rapidly processing large datasets and featuring capabilities to greatly extend the field of view. We also discuss possible artifacts and additional new features.
High-speed processing of X-ray wavefront marking data with the Unified Modulated Pattern Analysis (UMPA) model
De Marco, Fabio
;Savatović, Sara;Di Trapani, Vittorio;Margini, Marco;Lautizi, Ginevra;Thibault, Pierre
2023-01-01
Abstract
Wavefront-marking X-ray imaging techniques use e.g., sandpaper or a grating to generate intensity fluctuations, and analyze their distortion by the sample in order to retrieve attenuation, phase-contrast, and dark-field information. Phase contrast yields an improved visibility of soft-tissue specimens, while dark-field reveals small-angle scatter from sub-resolution structures. Both have found many biomedical and engineering applications. The previously developed Unified Modulated Pattern Analysis (UMPA) model extracts these modalities from wavefront-marking data. We here present a new UMPA implementation, capable of rapidly processing large datasets and featuring capabilities to greatly extend the field of view. We also discuss possible artifacts and additional new features.File | Dimensione | Formato | |
---|---|---|---|
oe-31-1-635.pdf
accesso aperto
Descrizione: Article
Tipologia:
Documento in Versione Editoriale
Licenza:
Copyright Editore
Dimensione
5.18 MB
Formato
Adobe PDF
|
5.18 MB | Adobe PDF | Visualizza/Apri |
6045777.pdf
accesso aperto
Descrizione: supplementary file
Tipologia:
Altro materiale allegato
Licenza:
Copyright Editore
Dimensione
890.37 kB
Formato
Adobe PDF
|
890.37 kB | Adobe PDF | Visualizza/Apri |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.