Helical sample-stepping for faster speckle-based multi-modal tomography with the Unified Modulated Pattern Analysis (UMPA) model

Speckle-based imaging (SBI) is a multi-modal X-ray imaging technique that gives access to absorption, phase-contrast, and dark-field signals from a single dataset. However, it is often difficult to disentangle the different signals from a single measurement. Having complementary data obtained by repeating the scan under slightly varied conditions (multiframe approach) can significantly enhance the accuracy of signal extraction and, consequently, improve the overall quality of the final reconstruction. In order to retrieve the different channels, SBI relies on a reference pattern, generated by the addition of a wavefront marker in the beam (i.e., a sandpaper or gratings). Here, we show how a continuous helical acquisition can extend the field of view (FOV) and speed up the acquisition while maintaining a multiframe approach for the signal retrieval of a test object.