MODESTI, SILVIO

MODESTI, SILVIO  

Dipartimento di Fisica  

Settore FIS/03 - Fisica della Materia  

Mostra records
Risultati 1 - 20 di 96 (tempo di esecuzione: 0.026 secondi).
Titolo Data di pubblicazione Autori File
Anisotropic ordered planar growth of a-Sexithienyl thin films 1-gen-1999 MORGANTE, ALBERTOMODESTI, SILVIO +
Atomic resolution composition analysis by scanning transmission electron microscopy high-angle annular dark-field imaging 1-gen-2003 MODESTI, SILVIOFRANCIOSI, ALFONSO +
Breaking of ground-state symmetry in core-excited ethylene and benzene 1-gen-1989 MODESTI, SILVIO +
Brillouin-scattering determination of the elastic constants of epitaxial fcc C60 film 1-gen-1995 MODESTI, SILVIO +
Ca chemisorption on Cu(100) in the submonolayer regime: Metastable and stable adsorption phases 1-gen-1993 MODESTI, SILVIO +
Charge transfer and structure in C60 adsorption on metal surfaces 1-gen-1995 MODESTI, SILVIO +
Chemisorption and fragmentation of C60 on Pt(111) and Ni(110) 1-gen-1996 MODESTI, SILVIO +
Comparison between extended x-ray-absorption and extended electron energy-loss fine-structure results above the M_{2},3 edge of cobalt 1-gen-1985 MODESTI, SILVIO +
Computational and experimental imaging of Mn defects on GaAs(110) cross-sectional surfaces 1-gen-2007 PERESSI, MARIAMODESTI, SILVIO +
Cooperative self-Assembly of Au Atoms and C60 on au(111) Surfaces 1-gen-1994 MODESTI, SILVIO +
Correction of systematic errors in scanning tunneling spectra on semiconductor surfaces: the energy gap of Si(111)-7x7 at 0.3 K 1-gen-2009 MODESTI, SILVIO +
Cross-sectional imaging of sharp Si intralayers enbedded in gallium arsenide 1-gen-2006 MODESTI, SILVIOPERESSI, MARIA +
Defect-induced perturbation on the Sn–Si(111) surface: a voltage-dependent scanning tunneling microscopy study 1-gen-2000 MODESTI, SILVIO +
Determination of the (3 x 3)-Sn/Ge(111) structure by photoelectron diffraction 1-gen-2001 MORGANTE, ALBERTOMODESTI, SILVIO +
Determination of the charge state of C60 adsorbed on metal surfaces 1-gen-1993 MODESTI, SILVIO +
Dispersion and intrinsic width of image resonances measured by resonant inelastic electron scattering: the alpha phase of Pb/Ge(111) 1-gen-1999 MODESTI, SILVIO +
Dissociation of CH species on Ni(111): A HREELS study 1-gen-1989 MORGANTE, ALBERTOMODESTI, SILVIO +
Doping of epitaxial graphene by direct incorporation of nickel adatoms 1-gen-2019 Carnevali, VirginiaPatera, Laerte LJugovac, MatteoModesti, SilvioComelli, GiovanniPeressi, MariaAfrich, Cristina +
Dynamics of the Si(100) surface 1-gen-1997 MODESTI, SILVIO +
Electron-hole plasma in direct-gap Ga_{1-x}Al_{x} As and k-selection rule 1-gen-1984 MODESTI, SILVIO +